The JIB-4000 is a focused ion beam sample milling system used for preparation of STEM/TEM samples and fabrication of cross section samples for SEM imaging. It is especially effective for applications such as semiconductor failure analysis.
The JIB-4000 supports simultaneous installation of a side entry goniometer stage for TEM samples and a bulk specimen stage. With enhanced resolution and high probe current, the system is capable of high resolution image acquisition and high speed milling. It is a compact unit with energy saving features.
The JIB-4000 incorporates a unique ion gun developed by utilizing JEOL's TEM/SEM technologies, enabling speedy sample milling. Use of the same holders as JEOL's TEM series allows for seamless operation from sample milling to imaging to analysis. The bulk specimen stage is effective for preparation of SEM cross section samples.
- Outstanding milling performance featuring the best throughput in the industry
- Compact unit with a 20% smaller footprint (compared to JEOL's comparable model) for easy setup
- Low accelerating voltage equal to best-in-class systems
- Optional stage navigation system for speedy identification of viewing positions