The Cross Section Polisher is an easy-to-use, sample preparation device for SEM, EPMA, and SAM applications. Soft, hard, and composite samples can now be prepared with minimum sample damage, smearing or deformation. An ion beam mills cross sections in almost any material creating a clean, polished cross section with a large viewing area.

With the Cross Section Polisher, a mirrored surface of almost any material is possible in a single step. This includes difficult-to-polish soft materials such as copper, aluminum, gold, solder, and polymers, as well as difficult-to-cut materials such as ceramic and glass. The high power optical microscope allows the user to position a sample to within a few microns of the precise cross section position. During milling, the sample is rocked automatically to avoid creating beam striations on the cross sectioned surface. Due to the glancing incidence of the ion beam, argon is not implanted into the sample surface.

Au NiP Cu
	Conventional mechanical polisher	Cross Section Polisher
Au NiP Cu
	Conventional mechanical polisher	Cross Section Polisher