Innovative cross section sample preparation device, combining JEOL's sophisticated technologies and expertise in applications.

- For samples too sensitive for mechanical polishing
For soft, hard, and composite samples
- Excellent mirror finish
Minimum distortion of samples; ideal for preliminary processing of samples for crystal orientation analysis (EBSD)
- Large cross sections 1 mm wide
Suitable for failure analysis of plated items and electronic devices
- Easy to use operation panel
Features
- Color LC operation panel
Milling conditions loaded by easy operation of LC operation panel
- CCD camera for sample position monitoring (standard)
Easy sample positioning/monitoring
- Ion accelerating voltage: Max. 8 kV (option)
For enhanced milling speed
Max. 6 kV (standard)
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