JEOL X-Ray Fluorescence Spectrometers perform elemental analysis to ensure electric and electronic devices meet regulations for hazardous substances.
JSX-3100RII Energy dispersive X-ray fluorescence spectrometer
High resolution liquid nitrogen free Si (Li) semiconductor detector.
JSX-3400RII Energy dispersive X-ray fluorescence spectrometer
Compliant to toxic substance regulations such as WEEE/RoHS and ELV directives in Europe and Japan’s Soil Contamination Countermeasures Law. For analysis of traces of toxic elements such as cadmium (Cd), lead (Pb), mercury (Hg), and chrome (Cr).
Highly advanced dioxin analysis mass spectrometer with advanced features such as a photo multiplier detector.
Highly sensitive, quadrupole mass spectrometer. Develops extremely stable operation over an extended period of time.
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