The JSX-3201M Element Analyzer is designed for speedy, non destructive analysis of the composition and thickness of solid, liquid, powder, and thin film samples. Integrating a high count EDS, the JSX-3201M features an outstanding level of sensitivity.
Features
- Analyzes C (carbon) to U (uranium)
- Auto sample exchanger for up to 16 samples
- Powerful X-ray source (150 kV, 3 mA, 150 W) for speedy, accurate analysis
- Digital pulse processor in EDS counter improving sensitivity (5 times higher than JEOL’s compatible models)
- DTP and SmileView programs to process spectral data, quantitative results, and image data of analytical spots
- Optional CCD for simultaneous viewing and analysis of micro area 1 mm in diameter
- Optional large specimen chamber for museum applications 460 mm × 360 mm × 150 mm