Liquid nitrogen free energy dispersive X-ray fluorescence spectrometer
- For RoHS compliance screening
- High resolution liquid nitrogen free Si (Li) semiconductor detector
- For regular X-ray fluorescence analysis of metals, rocks, soil, food, and plating thickness
- Speedy high sensitivity analysis
Superior performance and a complete set of software packages
| Speedy high sensitivity analysis of RoHS regulated substances |
Ease of operation (load and click) |
| High sensitivity detection of trace elements using a Si-Li semiconductor detector effective for heavy elements combined with an X-ray filter optimized for screening of RoHS regulated chemical substances. |
A single click on the dedicated analysis menu will begin screening of Cd, Pb, Hg, Br, and Cr, and display screening results after applying morphological and material correction. |
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| Analytical results in various forms (documentation software) |
Ni plating software (option) |
| The software offers user-programmable templates for management and documentation of RoHs compliance screening results. |
The software is designed to automatically correct the thickness of plating and the effect of substrate, enhancing the screening accuracy of Pb contained in plating. |
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