The Transmission Electron Microscope — TEM — has been used in all areas of biological and biomedical investigations because of its ability to view the finest cell structures. It is also used as a diagnostic tool in hospital pathology labs. For the crystallographer, metallurgist or semiconductor research scientist, current high voltage/high resolution TEMs, utilizing 200 keV to 1 MeV, have permitted the routine imaging of atoms, allowing materials researchers to monitor and design materials with custom-tailored properties. With the addition of energy dispersive X-ray analysis (EDXA) or energy loss spectrometry (EELS), the TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 0.5µm in diameter.
JEOL has produced TEMs since 1949, and currently markets state-of-the-art instruments in the 100 keV to 1 MeV ranges designed to support all TEM applications.
Our TEM product line is comprised of:
100 / 120 kV TEM
200 kV TEM/FEG TEM
IVEM 300 kV TEM/FEG TEM