The JEM-3200FS Field Emission Microscope, with in-column energy filter, combines high resolution and 0-loss sample imaging with analytical performance in a 300kV class analytical TEM. The new rotation-free imaging optical system facilitates acquisition of TEM imaging and diffraction patterns along with stable spectra.

The JEM-3200FS offers other advanced features such as a nanoactive goniometer with Piezo-controlled motorized stage, a directly coupled ion pump with a bake out function for clean specimen environments, quick beam select, and computer controlled data management and storage.