EDS analyzer for transmission electron microscopy (TEM)
The JED-2300T, an energy dispersive X-ray spectrometer, features a powerful data analysis program, Analysis Station, for enhanced ease of operation in qualitative/quantitative elemental analysis and for speedy acquisition of high resolution data in point/area analysis.
Integrated with the JEM-2100F, the JED-2300T automatically loads TEM parameters such as magnification and accelerating voltage as it acquires analytical data for future data management.
- Two types of silicon drift detectors (SDD) are available: standard 30 mm2 SDD and optional 100 mm2 SDD with a larger solid angle. The solid angle of the 100 mm2 SDD in the JEM-ARM200F (HRP) is 0.98 sr.
- JEOL's unique high sensitivity detector can easily identify light element peaks such as boron, carbon, nitrogen, and oxygen.
- Probe tracking (drift correction) can enhance analytical and repeat accuracies in high resolution imaging/high sensitivity analysis, significantly improving analytical throughput.
- The EDS system, when integrated with TEM PC, facilitates data acquisition and management.