A PC Controlled, WD/ED Combined System Opens Doors to New Ultra Micro Analysis
JEOL revolutionized surface analysis with an EPMA featuring a field emission (FE) electron gun, and now is proud to present a new upgraded FE-EPMA. The JXA-8530F operates on PC Windows for data acquisition and analysis while maintaining the powerful hardware of the JXA-8500F including the FE electron gun, EOS, and vacuum system to achieve the ultra micro area analysis. User friendly, PC-based operation facilitate quick and easy analyses at the highest magnifications.3nm secondary electron resolution.
- EPMA Quick Start
- User's Recipes
- "Click Point Analysis"
- Real time display of mixed X-ray images(WDS)
- EDS spectral imaging
- New analyzing crystal for ultra light elements