XPS for Surface Analysis
X-ray Photoelectron Spectroscopy (XPS) is an analytical technique to estimate the elemental composition and chemical state of the elements on the surface of a material by projecting soft X-ray onto the surface and detecting the energy of photoelectrons emitted from areas a few nm from the surface.
The photoelectron energy detected is specific to a certain element, and is determined by chemical bonding, reflecting chemical shift. Using X-rays as the source of excitation, XPS is effective in analyzing insulators.
XPS is a powerful analytical tool for material development and surface testing of a wide range of samples, including metals, semiconductors, high polymers, and advanced materials.
The JPS-9010 series offers three models to meet various research objectives and requirements: JPS-9010MC (with monochromatic X-ray source), JPS-9010MX, and JPS-9010TR featuring Total Reflection X-ray Photoelectron Spectroscopy (TRXPS), one of the first to incorporate this technique.
- High accuracy energy analyzer
- X-ray source to minimize damage to samples
- Compact X-ray monochromator
- Ultra high clean vacuum system; easy baking
- Versatile auto analysis to support routine analysis
- Large stage to accommodate large samples such as hard disk
- Easy to use software
- High speed peak separation software