The JSPM-4500 UHV SPM is designed for the high resolution study of surfaces. This instrument is available as individual components for labs that already have a suitable vacuum chamber or as a complete system including vacuum system. The complete package offers both a chamber for sample preparation and modification and a chamber for imaging. Additional chambers can be added to accommodate additional sample preparation and analysis. Atomic scale imaging with both AFM and STM modes is available. Variable temperature options allow imaging with sample temperatures from less than 20K to above 1500K. STM modes include CITS, I-V, S-V, and I-S. Standard AFM modes include contact, friction force microscopy, current image, non-contact and discrete contact with frequency detection, and phase imaging.