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   PRODUCTS : Electron Optics : Scanning Electron Microscopes (SEM) : Semi-in-Lens FE  
Electron Optics
Products
  
JEOL Semi-in-Lens Cold Cathode FE SEMs
  • Highest resolution SEMs; the cold cathode produces the finest probe size, especially at low accelerating voltages; the semi-in-lens pulls the secondary electrons off the surface by a detector in the objective lens, reducing noise at lower working distances.

Available Models

  Resolution Accelerating
Voltage
Magnification Stage
JSM-7500F 1.0nm (15kV)
1.4nm (1kV)
0.6nm (30kV) attainable
0.1 to 30 kV x25 to 1,000,000
(printed as a 120mm x 90mm micrograph)

Type I
X=70mm,
Y=50mm

Type II
X=110mm,
Y=80mm

Type III
X=140mm,
Y=80mm

JSM-7600F 1.0nm (15kV)
1.5nm (1kV)
0.6nm (30kV) attainable
0.1 to 30 kV x25 to 1,000,000
(printed as a 120mm x 90mm micrograph)
  

 
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