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   PRODUCTS : Electron Optics : Scanning Electron Microscopes (SEM) : Low Vacuum  
Electron Optics
Products
  
JEOL Conventional Tungsten Low Vacuum SEMs
  • For imaging and X-ray analysis of wet, nonconductive, unprepared samples.

Available Models

  Resolution Accelerating
Voltage
Magnification Stage

JSM-6390LV

HV 3.0nm
LV 4.0nm
0.5 to 30 kV x5 to 300,000 X=125mm, Y=100mm
JSM-6390LA

JSM-6490LV

HV 3.0nm
LV 4.0nm
0.3 to 30 kV x5 to 300,000 X=125mm, Y=100mm

JSM-6490LA

  

 
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