The JSM-6490LA is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless observation and EDS analysis. The take-off-angle for the JSM-6490LA is 35°, with an analytical working distance of 10mm.
The microscope has a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for observation of specimens which cannot be viewed at high vacuum due to excessive water content or due to a non-conductive surface. Standard automated features include Auto Focus/Auto Stigmator, Auto Gun (saturation, bias and alignment), and Automatic Contrast and Brightness.
Other features include:
- Fast, unattended data acquisition
- Smart settings for common samples
- Streamlined design
- Compact footprint
- Customized toolbars for repetitive functions
- Enhanced SE imaging
- Super conical lens
- Fully automatic vacuum system
- LV secondary electron detector (optional)
New features include:
- Improved low kV imaging in both high and low vacuum
- Multiple live image display (including picture in picture)
- Signal mixing
- Live, full screen image
- Video capability (.avi files)