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   PRODUCTS : Electron Optics : Scanning Electron Microscopes (SEM) : High Vacuum  
Electron Optics
Products
  
JEOL Conventional Tungsten High Vacuum SEMs
  • Ideal for failure analysis, inspection, and characterization.

Available Models

  Resolution Accelerating
Voltage
Magnification Stage
JCM-5700 5.0nm 0.5 to 20 kV x8 to 300,000 GS Type: X=20mm, Y=10mm, Z=5mm-48mm
MS Type: X=80mm, Y=40mm, Z=5mm-48mm
JSM-6390 3.0nm 0.5 to 30 kV x5 to 300,000 X=125mm, Y=100mm
JSM-6390A
JSM-6490 3.0nm 0.3 to 30 kV x5 to 300,000 X=125mm, Y=100mm
JSM-6490A
  

 
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