The JSM-6390A is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless observation and EDS analysis. The take-off-angle for for the JSM-6390A is 35°, with an analytical working distance of 10mm.
The microscope has a high resolution of 3.0nm. Standard automated features include Auto Focus/Auto Stigmator, Auto Gun (saturation, bias and alignment), and Automatic Contrast and Brightness.
Other features include:
- Fast, unattended data acquisition
- Smart settings for common samples
- Streamlined design
- Compact footprint
- Customized toolbars for repetitive functions
- Enhanced SE imaging
- Super conical lens
New features include:
- Improved low kV imaging
- Multiple live image display (including picture in picture)
- Signal mixing
- Live, full screen image
- Video capability (.avi files)