MultiBeam, a new high performance SEM and micro milling FIB, combines the most popular LaB6 electron column in the world with real time milling and monitoring capability. The JIB-4500 MultiBeam delivers high throughput and increased productivity with simultaneous viewing, analysis, and micro milling functions for a variety of applications.
Versatility
- Low vacuum operation for imaging non-conductive specimens without coating or alteration
- A gas injection system for etching and deposition
- A large stage for up to 150 mm samples
- A multiple port design for all your analytical needs
Productivity
- Serial slicing and sampling (S3) for monitoring, slicing, fabrication and reconstructing 3D images
- Maximum milling current for high throughput
- Standard airlock system for fast sample loading
Stability
- Provides stable imaging for milling / monitoring over extended periods of time
- High throughput milling of large areas (max milling current 30 nA)
- 5-axis eucentric goniometer stage
