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   NEWS & EVENTS : Press Releases  
JEOL News
  
JEOL Ltd. Press Releases
30
 JEOL Ltd (President Gon-emon Kurihara) has announced the introduction of a new FE SEM JSM-7100F into the market.   An SEM has been used w...

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30
  JEOL Ltd. (Tokyo, President: Gon-enon Kurihara) and Mentor Graphics Corporation (Oregon, President: Gregory ...

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02
We extend our deepest condolences to the victims of recent floods, and pray for their safety and well being.   JEOL is determined to help the peo...

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01
InTouchScope JSM-6010LA, developed and manufactured by JEOL, was awarded the MT-10 Award for Microscopy Innovation from Microscopy Today, a journal of...

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31
   JEOL Ltd. (Tokyo, President: Gon’emon Kurihara) and Siemens Healthcare Diagnostics Inc.(Tarrytown, NY, CEO: Michael Reitermann)have signe...

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29
JEOL new company set up and operational in India Having observed the acceleration occurring on scientific importance and business potentials, JEOL ...

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26
JEOL Ltd. (Gon’emon Kurihara, President) announced a new field emission scanning electron microscope, JSM-7800F, to be distributed immediately.  ...

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27
On the occasion of the inauguration of the 100th JEOL FEG-TEM in Europe at the Technical University Bergakademie Freiberg, JEOL Germany GmbH organized...

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18
As of the 1st of April, 2011, JEOL Ltd. and INCJ (The Innovation Network Corporation of Japan) have formed a new spinoff company, JEOL Resonance, dedi...

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25
March 25, 2011:  The JEOL Group expresses its deepest condolences to the victims of the March 11, 2011 earthquake and extends its profound sympat...

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10
A paper using the data acquired in JEOL’s atmospheric scanning electron microscope, ClairScope™, was introduced in the Editor’s Choice column of Scien...

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16

Observation of cells in a water environment at a higher resolution than is possible in optical microscopy

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12

Speedy imaging and analysis of samples as well as easy data acquisition

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30
ClairScope™ (JASM-6200), an atmospheric scanning electron microscope developed jointly by JEOL Ltd. and Japan's National Institute of Advanced Industr...

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22

JEOL puts SEM “Apps” at your fingertips

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20

Incorporating a New Spiral TOF Ion Optic System Capable of High Resolution Mass Analysis over a Wide Molecular Weight Range
 

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19

Demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind.

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