JEOL Ltd. (Gon’emon Kurihara, President) announced a new desktop electron microscope, JCM-5000 “NeoScope” to be distributed in September 2008.
[Background]
Today’s electronics manufacturers, including semiconductor device makers, are looking for electron microscopes featuring the same size and ease of operation as optical microscopes for inspection of their products developed and processed by micro technologies. The JCM-5000 NeoScope, a desktop electron microscope, is an answer to this increasing demand.
[Features]
- Simple operation
• Simple imaging procedure utilizing Auto Focus, Auto Contrast/Brightness
• Only 3 minutes from sample loading to imaging - Standard large stage to accommodate large samples
• XY stroke: 35 x 35 mm
• Sample height up to 50 mm supported - No sample treatment needed before imaging
• Imaging in High Vacuum or Low Vacuum mode
• 3 accelerating voltage levels at 5, 10, and 15 kV to insure high image quality - Wide area of view to facilitate identifying imaging spot
• Wide area of view at low magnification (lowest 10x)
• High quality live image display at 640x512 pixels for easy adjustment - Compact, light, and energy saving
• Consists of 3 modules: base unit, PC, and rotary pump
• Compact, light base unit: 492 mm(W) x 458 mm(D) x 434 mm(H); 63 kg
• Utility: Single phase 100 V to 240 V, 50/60 Hz, 350 VA only
[Specifications]
| Magnification |
10x to 20,000x |
| Imaging Modes |
High Vacuum, Low Vacuum |
| Electron Gun |
Small gun integrating filament and wehnelt |
| Accelerating Voltage |
3 stages at 15kV, 10kV, 5 kV |
| Specimen Stage |
Manual control; 2 axis stage |
| Movement Range |
X: 35 mm; Y: 35 mm |
| Maximum Sample Size |
70 mm |
| Height |
50 mm |
| Digital Image Display |
1280 x 1024 |
| Power Supply |
Single phase AC 100 to 240 V (fluctuation ±10%), 350 VA
Type D grounding |