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Entries for 'host'
host posted on April 20, 2012 08:03
JEOL Ltd. (Gon’emon Kurihara, President) announced a new desktop scanning electron microscope, JCM-6000 “NeoScopeTM” to be distributed in April 2012.
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host posted on February 10, 2011 03:10
A paper using the data acquired in JEOL’s atmospheric scanning electron microscope, ClairScope™, was introduced in the Editor’s Choice column of Scien...
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host posted on January 16, 2011 20:19
Observation of cells in a water environment at a higher resolution than is possible in optical microscopy
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host posted on December 12, 2010 22:18
Speedy imaging and analysis of samples as well as easy data acquisition
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host posted on September 30, 2010 01:45
ClairScope™ (JASM-6200), an atmospheric scanning electron microscope developed jointly by JEOL Ltd. and Japan's National Institute of Advanced Industr...
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host posted on September 22, 2010 08:30
JEOL puts SEM “Apps” at your fingertips
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host posted on May 20, 2010 09:58
Incorporating a New Spiral TOF Ion Optic System Capable of High Resolution Mass Analysis over a Wide Molecular Weight Range
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host posted on February 19, 2010 08:37
Demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind.
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host posted on October 04, 2009 16:08
Realizing Ultra-high Accurate Analysis of Nanostructures by Newly Developed Spectrometer
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host posted on August 13, 2009 11:05
A Scanning Electron Microscope Capable of Sample Imaging in Atmosphere
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host posted on July 15, 2009 11:41
Development of New Electron Microscope That Enables Analysis of Single Molecule - Single Atom
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host posted on July 14, 2009 10:03
host posted on June 01, 2009 09:41
National Nanotechnology Center at the King Abdulaziz City for Science and Technology (KACST) in Riyadh, Saudi Arabia
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host posted on March 08, 2009 22:13
Featuring sub angstrom resolution and atomic level analysis.
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host posted on January 13, 2009 08:41
High Resolution Atmospheric SEM Imaging of Cells in the Same Area of View as Optical Microscopy
host posted on January 09, 2009 03:21
JMS-T100GCV for Accurate, Superior Qualitative Analysis
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host posted on October 24, 2008 10:15
Cell energy density of 20 Wh/kg to 30 Wh/kg
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host posted on September 07, 2008 22:25
To be distributed in September 2008
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host posted on July 09, 2008 06:18
In recognition of the joint project that developed a new microscope featuring the world’s best spatial resolution of 0.5 nm.
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host posted on June 05, 2008 15:00
Combines high resolution imaging and high speed analysis
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host posted on May 23, 2008 10:52
Simple, Speedy Data Acquisition from a Variety of Samples
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host posted on April 10, 2008 15:26
Dedicated to servicing JEOL’s mass market products
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host posted on February 26, 2008 19:44
New Application in Solar Battery Manufacturing
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host posted on January 03, 2008 21:43
Featuring High Performance and Reliability to Meet Ubiquitous Needs
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host posted on October 16, 2007 17:25
Industry's SEM of Choice for 31 Years
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host posted on October 03, 2007 22:05
Enhanced energy density; enhanced copmpatibility with lead batteries
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host posted on October 03, 2007 21:47
A New Subsidiary Begins Operation in Early November
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host posted on October 03, 2007 21:36
Recognized for his work in 3D quantitative analysis of polymers in electron microscopy
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host posted on September 12, 2007 17:55
In Recognition of Customer Support Effort
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host posted on August 27, 2007 15:25
JEOL USA received a distinguished visitor at its Peabody, Massachusetts office on Tuesday, August 21st, when the 2007 Ernst Ruska Prize winner, Professor Hiroshi Jinnai of Kyoto Institute of Technology, visited JEOL’s U.S. headquarters.
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host posted on August 12, 2007 18:04
Ranked 1st and 6th in Two Different Equipment Categories
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host posted on July 10, 2007 19:48
Center houses JEOL’s JEM-2200FS with Omega filter and Cs corrector, JEM-2100F with STEM CS, and JSM-7401F
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host posted on July 02, 2007 22:20
The York JEOL Nanocentre officially opened at the University of York, Yorkshire, UK, on April 27, 2007, a new milestone for JEOL in Europe.
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host posted on April 23, 2007 09:08
World’s Highest Sensitivity Achieved by High Performance Auto Tune Probe
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host posted on April 09, 2007 00:00
Supercapacitor will be Exhibited with its New Module at TECHNO-FRONTIER 2007, the 22nd Power Supply Japan, at Makuhari Messe on April 18
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host posted on April 03, 2007 00:00
Satsuki Kogyo KK and Tachibana Denshi KK to be Merged as of July 1, 2007
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host posted on February 14, 2007 00:00
Featuring Enhanced Ease of Operation and Expandability
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host posted on February 14, 2007 00:00
Significantly Reduces Backscattered Electrons Entering Substrate
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host posted on November 09, 2006 00:00
Located in Beijing Economic-Technological Development Area
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host posted on November 06, 2006 00:00
Featuring Enhanced Ease of Operation and High Contrast Imaging
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host posted on September 18, 2006 00:00
Features outstanding energy density
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host posted on August 15, 2006 00:00
65 nm Compatible Semiconductor Failure Analysis System
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host posted on July 21, 2006 00:00
To meet rapidly growing demand in the CIS market
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host posted on July 03, 2006 00:00
Further enhances the semiconductor business of the JEOL Group
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host posted on May 01, 2006 22:01
Extreme Surface Imaging for Nano Applications
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host posted on April 17, 2006 00:00
JEM-3100F Field Emission Transmission Electron Microscope -- Fully digitized control for enhanced ease of operation
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host posted on January 23, 2006 00:00
JEM-9320FIB, Focused Ion Beam Specimen Preparation System -- A compact, energy saving, high speed milling device
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host posted on January 17, 2006 00:00
8 Models of JSM-6390/6490 Series Offer Unrivaled Performance and Ease of Operation
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host posted on September 06, 2005 00:00
New facility to produce prototypes of large volume, double layer capacitor products
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host posted on September 02, 2005 00:00
Reinforces resources in the BRICS countries (Brazil, Russia, India, China, and South Africa)
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host posted on April 28, 2005 00:00
Supports integrated production of medical equipment.
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host posted on April 18, 2005 00:00
The JSPM-5400 is the latest and most powerful system in that line of products, to be distributed on April 18, 2005.
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