host posted on April 20, 2012 08:03
FOR IMMEDIATE RELEASE
JEOL Ltd. (Gon’emon Kurihara, President) announced a new desktop scanning electron microscope, JCM-6000 “NeoScopeTM” to be distributed in April 2012.
[ Background ]
JEOL's JCM-5000 NeoScope, since it was announced, has been widely used by electronics manufacturers, including semiconductor device makers, as a desktop scanning electron microscope featuring the same ease of operation as optical microscopes for inspection of the products developed and processed by micro technologies. The new JCM-6000 "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide.
[ Features ]
1) Simple operation
- Easy touch panel operation
- A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness)
- Easy, dependable auto gun alignment (filament centering)
2) Enhanced low vacuum capability
- Enhanced quality of backscattered electron images
- Easy observation of non conductive samples in the direct low vacuum mode
- Only 2 minutes 30 seconds from sample loading to imaging
3) New capabilities for imaging
- Secondary electron imaging and backscattered electron imaging supported at high vacuum
- Dual frame imaging to facilitate comparison of live and retrieved images
- A wide magnification range from the lowest 10x for wide area of view up to 60,000x
4) A complete line of optional accessories
- Energy dispersive X-ray spectrometer
- Tilt/rotation motor drive specimen holder
*Both options are retrofittable
5) Compact, light, and energy saving
- Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kg
- Utility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA
[ Specifications ]
| Magnification |
10 to 60,000x |
| Imaging mode |
High vacuum/secondary electron, backscattered electron
Low vacuum/backscattered electron |
| Gun |
Small grid gun integrating filament and wehnelt |
| Accelerating voltage |
3 stages at 5 kV, 10 KV, 15 KV |
| Specimen stage |
Manual control; 2 axis stage
Movement range: X: 35; Y: 35
Maximum sample size: 70 dia.
Maximum sample height: 50 mm |
| Auto control |
Fully automated; auto focus, auto stigmator, auto contrast/brightness, auto gun alignment |
| Operation |
Touch panel or mouse |
| Digital image display |
1280 x 1024 pixels |
| Power supply |
Single phase 100 to 240 V (fluctuation within ±10%), 700 to 960 VA
Type D grounding |
| Option |
Energy dispersive X-ray spectrometer
Tilt/rotation motor drive holder |
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JEOL Ltd.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
For more information about JEOL Ltd. or any JEOL products, visit www.jeol.com, or call +81-42-543-1111.