mhioka_global posted on April 27, 2011 20:45
FOR IMMEDIATE RELEASE
On the occasion of the inauguration of the 100th JEOL FEG-TEM in Europe at the Technical University Bergakademie Freiberg, JEOL Germany GmbH organized the symposium `Current Developments in TEM´ (CDiT) to create a forum for discussion on recent developments and upcoming inventions in the field of transmission electron microscopy.
The 100th JEOL FEG-TEM in Europe is a JEM-2200FS CESCOR at the institute of materials science. The microscope was purchased within a German cluster of excellence called ADDE; an abbreviation for `Functional Structure Design by Atomic Design and Defect Engineering`. The responsible person is Prof. Rafaja, head of the chair of structure and texture analysis, who also hosted the symposium in his institute.
The symposium was opened by welcome talks given by Prof. D.C.Meyer, Vice-Rector of the Berga-kademie Freiberg, Dr. M. Iwatsuki, Senior Managing Director of JEOL Ltd and Dr. S. Falch, Managing Director of JEOL (Germany) GmbH. The scientific part of the symposium consisted of 18 talks, the laboratory tour to give the visitors the possibility to see the instrument and the social event – the conference dinner – including an evening session given by Prof. Rachel on recent developments in biological TEM. On both days, a number of additional posters were presented during the breaks.
The scientific presentations were given - among others - by Prof. M. Haider, CEOS (history and future of corrected TEM), Prof. T. Walter, Univ. Sheffield (recent results obtained with his JEOL R005), Dr. T. Oikawa, JEOL Ltd ( historic overview on JEOL TEM development) and Prof. A. Kirkland (exit wave function reconstruction with the double-corrected JEM-2200FS).
At the symposium participated 126 scientists and rated the event as very successful.
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JEOL Ltd.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
For more information about JEOL Ltd. or any JEOL products, visit www.jeol.com, or call +81-42-543-1111.