host posted on September 30, 2010 01:45
FOR IMMEDIATE RELEASE
ClairScope™ (JASM-6200), an atmospheric scanning electron microscope developed jointly by JEOL Ltd. and Japan's National Institute of Advanced Industrial Science and Technology, was awarded the MT-10 Award for Microscopy Innovation from Microscopy Today, a journal of the Microsco
py Society of America, and the R&D 100 Awards sponsored by R&D Magazine.
The MT-10 Award is given to the best new products and technologies in the field of microscopy. Winners are selected from a wide range of fields including optical microscopy, scanning probe microscopy, electron microscopy, ion microscopy acoustic microscopy, micro analysis, sample preparation, etc. The participants are judged for the importance and effectiveness of their products.
The official award ceremony was held at the 2010 Microscopy & Microanalysis in Portland Oregon.
About the R&D 100 Awards
The Awards, widely recognized as the "Oscars of Innovation", identifies and celebrates the top high technology products of the year. Sophisticated testing equipment, innovative new materials, chemistry breakthroughs, biomedical products, consumer items, high-energy physics: the R&D 100 Awards spans industry, academia, and government-sponsored research. (from R&D site)
ClairScope™ won these awards for its innovative approach to atmospheric imaging in electron microscopy, combining an electron and optical microscopes.
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JEOL Ltd.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
For more information about JEOL Ltd. or any JEOL products, visit www.jeol.com, or call +81-42-543-1111.