host posted on March 08, 2009 22:13
FOR IMMEDIATE RELEASE
JEOL Ltd. (Gon’emon Kurihara, President) announced a new transmission electron microscope, JEM-ARM200F, incorporating a spherical aberration corrector for the electron optic system as standard, to be distributed in March 2009.
[Background]
Transmission electron microscopes are designed to study the geometry and structure of substances at high resolution. They can also analyze the elements constituting substances and the status of electrons by incorporating various analyzers such as energy dispersive X-ray fluorescent spectrometer (EDS) and electron beam energy loss spectrometer (EELS).
A new technology has recently been introduced to correct spherical aberrations that have long restricted the resolving power of electron microscopes. Spherical aberration correctors significantly enhance the resolution and analytical capabilities, enabling ultimate atomic level analysis. The JEM-ARM200F is a powerful transmission electron microscope with a standard spherical aberration corrector, featuring sub angstrom resolution and atomic level analysis.
[Features]
- Atomic level resolution - STEM: 0.08 nm; TEM: 0.11 nm
- Standard spherical aberration corrector for electron optic system eliminating spherical aberrations
- Maximum accelerating voltage 200 kV
[Specifications]
| Resolution |
| Scanning transmission image * |
0.08 nm (at 200kV) |
| Transmission image |
0.19 nm (at 200 kV)
0.11 nm (at 200 kV; with spherical aberration corrector for image forming system) |
| Magnification |
| Scanning transmission image |
100 to 150,000,000x |
| Transmission image |
50 to 2,000,000x |
| Electron Gun |
Schottky field emission gun |
| Accelerating Voltage |
80 to 200 kV |
| Specimen Stage |
| Stage |
Eucentric side entry goniometer stage |
| Specimen Size |
3 mmΦ |
| Maximum tilt angle |
±25° (with double tilt holder) |
| Movement range |
X/Y: ±1 mm (motor drive / piezo drive) |
| Aberration Correctors |
| For electron optic system |
Standard |
| For image forming system |
Optional |
| Optional Accesories |
- Energy dispersive X-ray spectrometer (EDS)
- Electron beam energy loss spectrometer (EELS)
- CCD camera
|
* Dark field ring detector used
# # #
JEOL Ltd.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
For more information about JEOL Ltd. or any JEOL products, visit www.jeol.com, or call +81-42-543-1111.