posted on July 09, 2008 06:18
FOR IMMEDIATE RELEASE
On Saturday, June 14, 2008, Dr. Hiroshi Jinnai of Kyoto Institute of Technology and JEOL received the Minister of Education Award at the 7th Conference for Industrial-Academic Promotion held at the Kyoto International Conference Center.
The award was given in recognition of the joint project that developed a new microscope featuring the world’s best spatial resolution of 0.5 nm. The remarkable result was achieved by combining a 3D transmission electron microscope incorporating computer tomography, capable of 3D nano structure imaging, and new nano machining technologies for samples.
The new transmission electron microscope, JEM-2200FS, is a powerful tool for 3D structural analysis in nano dimensions, and is expected to contribute to nano materials development and other fields such as bioscience and energy research.
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JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
For more information about JEOL Ltd. or any JEOL products, visit www.jeol.com, or call +81-42-543-1111.