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JEOL - Stability, Performance, Productivity Friday, November 21, 2008
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  NEWS & EVENTS : Press Releases  
JEOL News
  
JEOL Ltd. Press Releases
Current News  Archived News  
Premlis® Supercapacitors
Friday, October 24, 2008 (323 reads)
Cell energy density of 20 Wh/kg to 30 Wh/kg
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JCM-5000 ”NeoScope,” A New Desktop Electron Microscope
Sunday, September 07, 2008 (1081 reads)
To be distributed in September 2008
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Dr. Jinnai / Kyoto Institute of Technology and JEOL Receive “Minister of Education Award”
Wednesday, July 09, 2008 (1270 reads)
In recognition of the joint project that developed a new microscope featuring the world’s best spatial resolution of 0.5 nm.
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JSM-7600F, a New Thermal Field Emission Scanning Electron Microscope
Thursday, June 05, 2008 (2089 reads)
Combines high resolution imaging and high speed analysis
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JIB-4600F, A New Multi Beam Milling/Imaging System
Friday, May 23, 2008 (2092 reads)
Simple, Speedy Data Acquisition from a Variety of Samples
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Datum Instruments, a New Member of JEOL Group
Thursday, April 10, 2008 (2035 reads)
Dedicated to servicing JEOL’s mass market products
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High Power Beam Source Business
Tuesday, February 26, 2008 (1734 reads)
New Application in Solar Battery Manufacturing
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MultiBeam, JIB-4500 - A New Milling and Imaging System
Thursday, January 03, 2008 (2030 reads)
Featuring High Performance and Reliability to Meet Ubiquitous Needs
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