JEOL News Volume 40, Number 1, 2005.

• Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using
• Cryoelectron Microscopy on Frozen-Hydrated Samples
• Direct Analysis in Real Time (DART™) Mass Spectrometry
• High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
• Recent Development of TEM for Advanced Ceramics
• Advanced Analysis Technology Supporting SiP
• FT NMR New Technical Introduction
  • Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
  • 100 Sample Auto Sample Changer and Tubeless NMR
  • Windows Delta
  • Latest Information and Future for ALICE2 Software
• Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
• Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
• Introduction of Wafer Edge SEM Review

JEOL News Volume 39, Number 2, 2004.

• TEM Study of Water in Carbon Nanotubes
• A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy
• Introduction of JWS-2000 Review SEM
• Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
• Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century
• Introduction of Products

JEOL News Volume 39, Number 1, 2004.

• A Double Aberration Corrected, Energy Filtered HREM/STEM
• Variable Magnification of Electron Holography for Junction Profiling of Semiconductor Devices with Dual Lens System on JEOL JEM-2010F
• The Electron Backscatter Diffraction Technique – A Powerful Tool to Study Microstructures by SEM
• Growth and Encystment of the Ciliate Tetrahymena sp. Found in a Dead Mosquito's Larva
• ALCHEMI Studies on Quasicrystals
• Electron Spin Resonance Spectroscopy in Food Radiation Research
• Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM
• Introduction of new products

JEOL News Volume 38, Number 2, 2003.

• Atomic Resolved HAADF-STEM for Composition Analysis
• Atomic Structure Analysis
• Direct Imaging of a Local Thermal Vibration Anomaly Through In-situ High-temperature ADF-STEM
• Cold-spray Ionization Mass Spectrometric Observation of Biomolecules in Solution
• Electron Spin Resonance (ESR) in Nanocarbon Research
• Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy
• JWS-3000 High-Resolution Review SEM
• Application and Extension of Pickup Method to Various Materials
• Introduction of New Products

JEOL News Volume 38, Number 1, 2003.

• Mapping of sp²/sp³ in DLC Thin Film by Signal Processed ESI series Energy Loss Image
• Electron Holographic Analysis of Nanostructured Gold Catalyst
• Single Atomic Column Observation in Silicon Boundary
• The Scanning Electron Microscope as a Tool for Experimental Nanomechanics
• Observation of Dislocation Structure of Fatigued Metallic Materials by Scanning Electron Microscopy
• Protein NMR - Ability of the JNM-ECA series
• Development of the JBX-3030MV Mask Making E-Beam Lithography System
• Chromatic and Spherical Aberration Correction in the LSI Inspection Scanning Electron Microscope
• Peak Deconvolution Analysis in Auger Electron Spectroscopy II
• Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer
• Introduction of New Products

JEOL News Volume 37, Number 1, 2002.

• A C_s Corrected HRTEM: Initial Applications in Materials Science
• Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
• Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
• Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
• Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
• A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
• Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
• Development of Nano-Analysis Electron Microscope JEM-2500SE
• Development of JSM-7400F; New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
• Applications of Image Processing Technology in Electron Probe Microanalyzer
• Technology of Measuring Contact Holes Using Electric Charge in a Specimen
• Organic EL Display Production Systems - ELVESS Series
• In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
• Peak Deconvolution of Analysis in Auger Electron Spectroscopy
• JEOL's Challenge to Nanotechnology
• Progress in Development of High-Density Reactive Ion Plating
• Applications of High-Power Built-in Plasma Gun
• Introduction of New Products

JEOL News Volume 35, Number 1, 2000.

• 100kV E-Beam Lithography System: JBX-9300FS
• Gate Oxide Characterization using Annualr Dark Field Imaging
• JEOL Intro of New Products
• Kankan Diamonds (Guinea): probing the lower mantle

JEOL News, Volume 34, Number 1, 1999.

• A 1000kV TEM Running Over 25 Years
• Atomic Resolution Z-Contrast Imaging of Interfaces and Defectst
• The Growing Role of Electron Crystallography in Structural Biology
• Factors Promoting R&D in Electron Microscopy in Japan
• The Development and Assessment of a High Performance FE Gun Analytical HREM for Materials Science Applications
• Immunogold-labeling in Scanning Electron Microscopy
• Measure Contact Potential Difference Using an Ultrahigh Vacuum Noncontact Atomic Force Microscope
• Microscopic Chemical State Analysis by FE-SAM with Hemispherical Energy Analyzer
• Miniaturized STM Working Simultaneously in UHV Electron Microscope
• High-Resolution Electron-Beam Lithography and Its Application toMOS Devices
• Development of Optical Technology for JEOL's Electron Probe Instruments
• Observation of Protein Structures through an Electron Beam
• Transition of JEOL's Semiconductor Equipment, and Future Development
• Applicatrion of Semi-in-Lens FESEM for Chargeless Observation
• Development History of JEOL's Transmission Electron Microscopes