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   NEWS & EVENTS : JEOL NEWS Magazine  
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JEOL NEWS Magazine

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Volume 44, Number 1, August 2009 - JEOL 60th Anniversary Issue
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JEOL News Volume 44, Number 1, August 2009 / JEOL 60th Anniversary Issue.

  • Congratulatory Message for the 60th Anniversary of JEOL
  • Congratulations from Arizona State University
  • Marking Our 60th Anniversary
  • Aiming for Best Total Solutions
  • Exit Wavefunction Reconstruction
  • Single Shot Nanosecond Imaging in the Dynamic TEM
  • An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
  • Observation of Membrane Proteins Through An Electron Beam
  • HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
  • Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
  • Development of Nanoimprint Mold Using JBX-9300FS
  • Introduction of New Products


File size 8509 K
Downloads 24
Date Tue 11/24/2009 @ 09:51
Author JEOL Webmaster
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Volume 43, Number 1, July 2008
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JEOL News Volume 43, Number 1, July 2008.
View the abstract of the latest issue in pdf

  • Interface Studies by Cs-Corrected STEM
  • Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
  • Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
  • Quantitative Electron Microscopy Using Digital Data Processing
  • Case Study on Failure Analysis by Electron Beam Absorbed Current Method
  • Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
  • Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
  • High Power Electron Beam Source Used for Melting Metal Materials
  • Introduction of New Products


File size 7339 K
Downloads 300
Date Fri 03/20/2009 @ 01:34
Author JEOL Webmaster
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Volume 42, Number 1, 2007
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JEOL News Volume 42, Number 1, 2007.

  • Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging
  • Improvement of Reflection Electron Microscopy: LODREM
  • Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM
  • A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water
  • High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates
  • Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images
  • New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates
  • Auger Analyses Using Low Angle Incident Electrons
  • Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS)
  • Introduction of New Products


File size 3044 K
Downloads 295
Date Wed 09/17/2008 @ 03:30
Author JEOL Webmaster
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Volume 41, Number 1, 2006
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JEOL News Volume 41, Number 1, 2006.

  • The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
  • Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
  • Visualization of Biological Nano-Machines at Subnanometer Resolutions
  • Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
  • Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
  • Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
  • Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass
    Spectrometry
  • Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy


File size 2779 K
Downloads 369
Date Tue 09/26/2006 @ 10:55
Author JEOL Webmaster
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JEOL NEWS Magazine Archive Issues

 

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Volume 40, Number 1, 2005  --  DOWNLOAD
 Hits: 1510 Updated:
Sat 01/01/2005 @ 09:33

JEOL News Volume 40, Number 1, 2005.

  • Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using
  • Cryoelectron Microscopy on Frozen-Hydrated Samples
  • Direct Analysis in Real Time (DART™) Mass Spectrometry
  • High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
  • Recent Development of TEM for Advanced Ceramics
  • Advanced Analysis Technology Supporting SiP
  • FT NMR New Technical Introduction
    • Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
    • 100 Sample Auto Sample Changer and Tubeless NMR
    • Windows Delta
    • Latest Information and Future for ALICE2 Software
  • Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
  • Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
  • Introduction of Wafer Edge SEM Review


Volume 39, Number 2, 2004  --  DOWNLOAD
 Hits: 738 Updated:
Tue 06/01/2004 @ 09:32

JEOL News Volume 39, Number 2, 2004.

  • TEM Study of Water in Carbon Nanotubes
  • A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy
  • Introduction of JWS-2000 Review SEM
  • Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
  • Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century
  • Introduction of Products


Volume 39, Number 1, 2004  --  DOWNLOAD
 Hits: 524 Updated:
Thu 01/01/2004 @ 09:29

JEOL News Volume 39, Number 1, 2004.

  • A Double Aberration Corrected, Energy Filtered HREM/STEM
  • Variable Magnification of Electron Holography for Junction Profiling of Semiconductor Devices with Dual Lens System on JEOL JEM-2010F
  • The Electron Backscatter Diffraction Technique – A Powerful Tool to Study Microstructures by SEM
  • Growth and Encystment of the Ciliate Tetrahymena sp. Found in a Dead Mosquito's Larva
  • ALCHEMI Studies on Quasicrystals
  • Electron Spin Resonance Spectroscopy in Food Radiation Research
  • Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM
  • Introduction of new products


Volume 38, Number 2, 2003  --  DOWNLOAD
 Hits: 421 Updated:
Sun 06/01/2003 @ 09:26

JEOL News Volume 38, Number 2, 2003.

  • Atomic Resolved HAADF-STEM for Composition Analysis
  • Atomic Structure Analysis
  • Direct Imaging of a Local Thermal Vibration Anomaly Through In-situ High-temperature ADF-STEM
  • Cold-spray Ionization Mass Spectrometric Observation of Biomolecules in Solution
  • Electron Spin Resonance (ESR) in Nanocarbon Research
  • Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy
  • JWS-3000 High-Resolution Review SEM
  • Application and Extension of Pickup Method to Various Materials
  • Introduction of New Products


Volume 38, Number 1, 2003  --  DOWNLOAD
 Hits: 642 Updated:
Wed 01/01/2003 @ 09:27

JEOL News Volume 38, Number 1, 2003.

  • Mapping of sp2/sp3 in DLC Thin Film by Signal Processed ESI series Energy Loss Image
  • Electron Holographic Analysis of Nanostructured Gold Catalyst
  • Single Atomic Column Observation in Silicon Boundary
  • The Scanning Electron Microscope as a Tool for Experimental Nanomechanics
  • Observation of Dislocation Structure of Fatigued Metallic Materials by Scanning Electron Microscopy
  • Protein NMR - Ability of the JNM-ECA series
  • Development of the JBX-3030MV Mask Making E-Beam Lithography System
  • Chromatic and Spherical Aberration Correction in the LSI Inspection Scanning Electron Microscope
  • Peak Deconvolution Analysis in Auger Electron Spectroscopy II
  • Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer
  • Introduction of New Products


Volume 37, Number 1, 2002  --  DOWNLOAD
 Hits: 807 Updated:
Tue 01/01/2002 @ 12:49

JEOL News Volume 37, Number 1, 2002.

  • A Cs Corrected HRTEM: Initial Applications in Materials Science
  • Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
  • Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
  • Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
  • Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
  • A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
  • Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
  • Development of Nano-Analysis Electron Microscope JEM-2500SE
  • Development of JSM-7400F; New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
  • Applications of Image Processing Technology in Electron Probe Microanalyzer
  • Technology of Measuring Contact Holes Using Electric Charge in a Specimen
  • Organic EL Display Production Systems - ELVESS Series
  • In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
  • Peak Deconvolution of Analysis in Auger Electron Spectroscopy
  • JEOL's Challenge to Nanotechnology
  • Progress in Development of High-Density Reactive Ion Plating
  • Applications of High-Power Built-in Plasma Gun
  • Introduction of New Products


Volume 35, Number 1, 2000  --  DOWNLOAD
 Hits: 847 Updated:
Sat 01/01/2000 @ 12:31

JEOL News Volume 35, Number 1, 2000.

  • 100kV E-Beam Lithography System: JBX-9300FS
  • Gate Oxide Characterization using Annualr Dark Field Imaging
  • JEOL Intro of New Products
  • Kankan Diamonds (Guinea): probing the lower mantle


Volume 34, Number 1, 1999  --  DOWNLOAD
 Hits: 890 Updated:
Fri 01/01/1999 @ 12:56

JEOL News, Volume 34, Number 1, 1999.

  • A 1000kV TEM Running Over 25 Years
  • Atomic Resolution Z-Contrast Imaging of Interfaces and Defectst
  • The Growing Role of Electron Crystallography in Structural Biology
  • Factors Promoting R&D in Electron Microscopy in Japan
  • The Development and Assessment of a High Performance FE Gun Analytical HREM for Materials Science Applications
  • Immunogold-labeling in Scanning Electron Microscopy
  • Measure Contact Potential Difference Using an Ultrahigh Vacuum Noncontact Atomic Force Microscope
  • Microscopic Chemical State Analysis by FE-SAM with Hemispherical Energy Analyzer
  • Miniaturized STM Working Simultaneously in UHV Electron Microscope
  • High-Resolution Electron-Beam Lithography and Its Application toMOS Devices
  • Development of Optical Technology for JEOL's Electron Probe Instruments
  • Observation of Protein Structures through an Electron Beam
  • Transition of JEOL's Semiconductor Equipment, and Future Development
  • Applicatrion of Semi-in-Lens FESEM for Chargeless Observation
  • Development History of JEOL's Transmission Electron Microscopes


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