JEOL Ltd. - scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, mass spectrometers, NMR spectrometers, and semiconductor tools.

JEOL - Stability, Performance, Productivity

Saturday, July 04, 2009
Login
Register

USA Europe Japan

HOME
       Site Map
       Search
       JEOL Regional Web Sites
ABOUT US
       The Company
       ISO Certification
       Investor Relations
       History
       Milestones
PRODUCTS
       JEOL Products & Resources
          Documents and Downloads
          Image Galleries
          Product Presentations
       Electron Optics
          Scanning Electron Microscopes (SEM)
             High Vacuum/Low Vaccum
                JSM-6510
                JSM-6510LV
                JSM-6610
                JSM-6610LV
                JCM-5700 CarryScope™
                JCM-5000 NeoScope
             Analytical SEM
                JSM-6510A / 6510LA
                JSM-6610A / 6610LA
             Conventional FE
                JSM-7001F
             Semi-in-Lens FE
                JSM-6701F
                JSM-7500F
                JSM-7600F
          Transmission Electron Microscopes (TEM)
             100/120 kV
                JEM-1011
                JEM-1400
             200 kV
                JEM-2100F
                JEM-2100 LaB6
                JEM-2200FS
                JEM-2500SE
                JEM-ARM200F
             300 kV
                JEM-3100F
                JEM-3200FS
                JEM-3200FSC
          Scanning Probe Microscopes (SPM)
             JSPM-4500
             JSPM-5200
             JSPM-5400
          Surface Analysis (SA)
             JAMP-9500F
             JXA-8230
             JXA-8530F
             JPS-9200
             JPS-9010 Series
          MultiBeam (SEM-FIB)
             JIB-4500
             JIB-4600F
       Analytical Instruments
          Mass Spectrometers
             AccuTOF™ DART™
             AccuTOF™ GC
             AccuTOF™ LC
             GCmate™ II
             MStation™
             800D
             Q1000GC
          Nuclear Magnetic Resonance
             ECS
             ECX
             ECA
             Delta™ NMR Software
             CapNMR™ Probe
             Probes
             Magnets
             Sample Changers
          Electron Spin Resonance
             JES-FA100
             JES-FA200
             JES-FA300
       Semiconductor Equipment
          Electron Beam Lithography
             JBX-3050MV
             JBX-5500FS
             JBX-6300FS
             JBX-9300FS
          Wafer Inspection SEM
             JWS-2000
             JWS-3000
             JWS-7855S
             JFAS-7000BT Beam Tracer
             WM-7000
             WM-10
             WM-7
          Fine Process Inspection
             JFS-9855S
             JEM-9320FIB
             EMU-220/330
       Sample Preparation Equipment
          Cross Section Polisher
          Ion Slicer
          Vacuum Evaporator
          JEM-9320FIB
       Medical Equipment
          BioMajesty™ Series
             JCA-BM 6010
             JCA-BM 6050
             JCA-BM 9130
             JCA-BM 2250
             JCA-BM 8000 Series
          Amino Acid Analyzer
             AminoTac™
       Industrial Equipment
          High-Power Electron Beam Source
          Electron Beam Source
          EB Source Power Supply
          Plasma Source
          Electron Beam Source (New Model)
       Environmental Equipment
          JSX-3100RII
          JSX-3400RII
          JSX-3202M
          800D
          Q1000GC
SERVICE
       Network
       Offices
NEWS & EVENTS
       What's New
       Press Releases
       Events & Shows
       JEOL NEWS Magazine
CONTACT US
       JEOL Headquarters
       Local & Regional Offices
       Request Product Info

HOME

JEOL is committed to providing our customers with high-performance products and technical expertise to help them achieve their goals.

JEOL Regional Web Sites

find a web site near you

Recent News

Technology in Emerging Markets

6/1/2009 9:41:50 AM

JEM-ARM200F, An Ultimate Atomic Resolution Transmission Electron Microscope

3/8/2009 10:13:16 PM

New Scanning Electron Microscope Capable of Observing Cells in Solution

1/12/2009 4:06:42 AM

Welcome to JEOL Ltd.

Thank you for your interest in JEOL Ltd. We are a leading supplier of scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), scanning probe microscopes (SPMs), mass spectrometers, NMR spectrometers, and semiconductor tools for scientific and industrial purposes. We provide applications-specific solutions that advance our customers' diverse objectives — from routine analysis of organic and inorganic specimens to breakthroughs in nanotechnological development.

	ELECTRON OPTICS INSTRUMENTS
	Easy to use, flexible for a variety of applications, and backed by JEOL’s award-winning support, JEOL electron microscopes play an influential role in the development of new products and materials, analysis for quality control and forensic investigations, biological research, and more. more >
	ANALYTICAL INSTRUMENTS
	JEOL analytical instruments serve a variety of needs in the biomedical, pharmaceutical, chemical, and environmental fields. more >
	SEMICONDUCTOR EQUIPMENT
	JEOL offers leading-edge solutions for 200/300mm, nano-fabrication processes, and nanoscience research -- backed by award-winning 24/7 service support and long-term commitment to our customers. more >
	SAMPLE PREPARATION EQUIPMENT
	JEOL produces high precision instruments designed to prepare samples prior to imaging with the SEM or TEM. more >
	MEDICAL EQUIPMENT
	JEOL’s innovative, cost-effective systems for medical diagnoses and analyses integrate routine clinical chemistry, hematology, immunodiagnostics, and laboratory automation. more >
	INDUSTRIAL EQUIPMENT
	JEOL’s advanced electron beam and plasma technologies are used to create high-quality, high-performance optical films and platings. more >
	ENVIRONMENTAL EQUIPMENT
	JEOL X-Ray Fluorescence Spectrometers perform elemental analysis to ensure electric and electronic devices meet regulations for hazardous substances. more >

JEM-ARM200F

JEM-ARM200F, atomic resolution analytical microscope, delivers the highest resolution commercially available in its class with an advanced aberration-corrected TEM technology. Through a rigorous program of development to realize customer's expectations, the JEOL team has produced an entirely new platform of TEM that achieves a guaranteed STEM (HAADF) resolution of 0.08 nm.

[ more ]

New FT-NMR Series

The new ECS series of FT-NMRs achieves the highest sensitivity level in the world with its high performance auto tune probe. The compact system requires half of the installation space of a conventional unit. Advanced software and networking capability plus automatic routines simplify operation.

[ more ]

In order to properly access our site, document library, product presentations and tutorials, we recommend the following minimum standards for browsers and document readers:

Internet Explorer / Netscape Navigator v5 and above
Adobe Acrobat Reader v5 and above
Adobe Flash v6 and above
JavaScript enabled