Thank you for your interest in JEOL Asia. We are a leading supplier of scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), scanning probe microscopes (SPMs), mass spectrometers, NMR spectrometers, and semiconductor tools for scientific and industrial purposes. We provide applications-specific solutions that advance our customers' diverse objectives — from routine analysis of organic and inorganic specimens to breakthroughs in nanotechnological development.

The JSX-3400R is an element analyzer (energy dispersive fluorescent X-ray analyzer) designed for environmental studies The JSX-3400R complies to two directives of the European Union (EU) -- Waste Electrical and Electronic Equipment (WEEE) and Restricting the use of Hazardous Substances (RoHS).

The light microscope has an advantage of observing natural colors. On the other hand, the SEM features higher resolution and larger depth of focus than light microscopes or laser microscopes. The SEM is widely used in research laboratories and for quality assurance in the manufacturing industries.

The Cross Section Polisher is an easy-to-use, sample preparation device for SEM, EPMA, and SAM applications. Soft, hard, and composite samples can now be prepared with minimum sample damage, smearing or deformation. An ion beam mills cross sections in almost any material creating a clean, polished cross section with a large viewing area.

Innovative Specimen Preparation Method for TEM / STEM / SEM / EPMA / AUGER The Ion Slicer can prepare thin-film specimens without solvents or chemicals and requires no prior treatment of the specimen other than rectangular slicing (no disc grinding or dimple grinding).

The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to 120kV, the JEM-1400 is suitable for biological, polymer and materials science applications.