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JEOL is an innovator in developing instruments used in advanced scientific research and breakthrough technology.

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Recent News

JEOL Mass Spectrometry seminar

19th International Mass Spectrometry Conference

JEOL Installs a new JSM-7800F in colaboration with the University of Queensland

JCM-6000 ”NeoScope™”, A New Desktop Scanning Electron Microscope

JEOL RESONANCE Introduces Worlds' Fastest and Smallest Solid State NMR Probe

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Welcome to JEOL Ltd.

Thank you for your interest in JEOL Ltd. We are a leading supplier of scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), scanning probe microscopes (SPMs), mass spectrometers, NMR spectrometers, and semiconductor tools for scientific and industrial purposes. We provide applications-specific solutions that advance our customers' diverse objectives — from routine analysis of organic and inorganic specimens to breakthroughs in nanotechnological development.

	ELECTRON OPTICS INSTRUMENTS
	Easy to use, flexible for a variety of applications, and backed by JEOL’s award-winning support, JEOL electron microscopes play an influential role in the development of new products and materials, analysis for quality control and forensic investigations, biological research, and more. more >
	ANALYTICAL INSTRUMENTS
	JEOL analytical instruments serve a variety of needs in the biomedical, pharmaceutical, chemical, and environmental fields. more >
	SEMICONDUCTOR EQUIPMENT
	JEOL offers leading-edge solutions for 200/300mm, nano-fabrication processes, and nanoscience research -- backed by award-winning 24/7 service support and long-term commitment to our customers. more >
	SAMPLE PREPARATION EQUIPMENT
	JEOL produces high precision instruments designed to prepare samples prior to imaging with the SEM or TEM. more >
	MEDICAL EQUIPMENT
	JEOL’s innovative, cost-effective systems for medical diagnoses and analyses integrate routine clinical chemistry, hematology, immunodiagnostics, and laboratory automation. more >
	INDUSTRIAL EQUIPMENT
	JEOL’s advanced electron beam and plasma technologies are used to create high-quality, high-performance optical films and platings. more >
	ENVIRONMENTAL EQUIPMENT
	JEOL X-Ray Fluorescence Spectrometers perform elemental analysis to ensure electric and electronic devices meet regulations for hazardous substances. more >

JCM-6000

High performance system in a compact, innovative body.

The JCM-6000 features intuitive touch panel operation through easy to follow views and menus. Utilizing secondary electron and backscattered electron detectors, the system captures a variety of images.

Its direct low vacuum mode (speedy access in 2.5 minutes) facilitates imaging of non conductive samples.

JSM-7800F

Thermal field emission scanning electron microscope We provide high performance. You enjoy freedom. Incorporating a new super hybrid objective lens, the JSM-7800F is capable of high resolution imaging and high speed, high accuracy elemental analysis. It is an ultimate analytical tool that can be used for wide ranging applications.

Centurio

Centurio is a new generation of Silicon Drift Detector (SDD) EDS for ultrafast, ultrasensitive collection of X-rays through analysis with JEOL S/TEMs. Features include the ability to collect X-rays from samples at an unprecedented large solid angle of up to 0.98 steradians from a detection area of 100mm².

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JEM-ARM200F

JEM-ARM200F, atomic resolution analytical microscope, delivers the highest resolution commercially available in its class with an advanced aberration-corrected TEM technology. Through a rigorous program of development to realize customer's expectations, the JEOL team has produced an entirely new platform of TEM that achieves a guaranteed STEM (HAADF) resolution of 0.08 nm.

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New FT-NMR Series

The new ECS series of FT-NMRs achieves the highest sensitivity level in the world with its high performance auto tune probe. The compact system requires half of the installation space of a conventional unit. Advanced software and networking capability plus automatic routines simplify operation.

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