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Proven SuccessJEOL provides our customer with high performance, reliable scientific instruments that are used for critical research, investigation, and analysis.
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Welcome to JEOL Ltd.

Thank you for your interest in JEOL Ltd. We are a leading supplier of scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), scanning probe microscopes (SPMs), mass spectrometers, NMR spectrometers, and semiconductor tools for scientific and industrial purposes. We provide applications-specific solutions that advance our customers' diverse objectives — from routine analysis of organic and inorganic specimens to breakthroughs in nanotechnological development.

Electron Optics

ELECTRON OPTICS INSTRUMENTS

 

Easy to use, flexible for a variety of applications, and backed by JEOL’s award-winning support, JEOL electron microscopes play an influential role in the development of new products and materials, analysis for quality control and forensic investigations, biological research, and more.

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Analytical Instruments ANALYTICAL INSTRUMENTS
 

JEOL analytical instruments serve a variety of needs in the biomedical, pharmaceutical, chemical, and environmental fields.

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Semiconductor Equipment SEMICONDUCTOR EQUIPMENT
 

JEOL offers leading-edge solutions for 200/300mm, nano-fabrication processes, and nanoscience research -- backed by award-winning 24/7 service support and long-term commitment to our customers.

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Sample Preparation Equipment SAMPLE PREPARATION EQUIPMENT
 

JEOL produces high precision instruments designed to prepare samples prior to imaging with the SEM or TEM.

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Medical Equipment MEDICAL EQUIPMENT
 

JEOL’s innovative, cost-effective systems for medical diagnoses and analyses integrate routine clinical chemistry, hematology, immunodiagnostics, and laboratory automation.

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Industrial Equipment INDUSTRIAL EQUIPMENT
 

JEOL’s advanced electron beam and plasma technologies are used to create high-quality, high-performance optical films and platings.

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Environmental Equipment ENVIRONMENTAL EQUIPMENT
 

JEOL X-Ray Fluorescence Spectrometers perform elemental analysis to ensure electric and electronic devices meet regulations for hazardous substances.

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Centurio

Centurio is a new generation of Silicon Drift Detector (SDD) EDS for ultrafast, ultrasensitive collection of X-rays through analysis with JEOL S/TEMs. Features include the ability to collect X-rays from samples at an unprecedented large solid angle of up to 0.98 steradians from a detection area of 100mm2.

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JEM-ARM200F

JEM-ARM200F, atomic resolution analytical microscope, delivers the highest resolution commercially available in its class with an advanced aberration-corrected TEM technology. Through a rigorous program of development to realize customer's expectations, the JEOL team has produced an entirely new platform of TEM that achieves a guaranteed STEM (HAADF) resolution of 0.08 nm.

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JSM-6010LA InTouchScope™

The InTouchScope™ offers a whole new SEM experience with the familiar look and feel of today’s personal electronic media.

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New FT-NMR Series

ECS-400

The new ECS series of FT-NMRs achieves the highest sensitivity level in the world with its high performance auto tune probe. The compact system requires half of the installation space of a conventional unit. Advanced software and networking capability plus automatic routines simplify operation.

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